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A curved-crystal spectrometer for soft X-ray emission studies of metals and metallic alloys = Ein gekruemmtes Kristallspektrometer fuer die Untersuchung der Emission weicher Roentgenstrahlen von Metallen und LegierungenZSCHECH, E; BLAU, W; WEHNER, B et al.Crystal research and technology (1979). 1984, Vol 19, Num 7, pp 1007-1014, issn 0232-1300Article

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experimentsWANG, S.-K; DAI, P; TAUB, H et al.Journal of applied crystallography. 1993, Vol 26, pp 697-705, issn 0021-8898, 5Article

A personal-computer-controlled single-crystal diffractometerSVENSSON, C; STAHL, K.Journal of applied crystallography. 1993, Vol 26, pp 728-729, issn 0021-8898, 5Article

Angle calculations for a six-circle surface X-ray diffractometerLOHMEIER, M; VLIEG, E.Journal of applied crystallography. 1993, Vol 26, pp 706-716, issn 0021-8898, 5Article

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An automatic four-circle diffractometer designed for precise lattice-parameter determinationKUCHARCZYK, D; PIETRASZKO, A; ŁUKASEWICZ, K et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 467, 3Article

Accuracy in powder diffraction II. International conferencePRINCE, E; STALICK, J. K.NIST special publication. 1992, Num 846, issn 1048-776X, 237 p.Conference Proceedings

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Schnelle Badanalyse vermindert die Kosten der Aluminiumverhuettung = Fast electrolytic melt analysis reduces the costs of the aluminium smeltingAluminium (Düsseldorf). 1984, Vol 60, Num 9, issn 0002-6689, 650Article

Characterization of Pousao Pigments and Extenders by Micro-X-ray Diffractometry and Infrared and Raman MicrospectroscopyCORREIA, Andreia M; OLIVEIRA, Maria J. V; CLARK, Robin J. H et al.Analytical chemistry (Washington, DC). 2008, Vol 80, Num 5, pp 1482-1492, issn 0003-2700, 11 p.Article

An open-flow helium cryostat for single-crystal X-ray diffraction experimentsHARDIE, M. J; KIRSCHBAUM, K; MARTIN, A et al.Journal of applied crystallography. 1998, Vol 31, pp 815-817, issn 0021-8898, 5Article

Accurate cells from area-detector imagesDUISENBERG, A. J. M; HOOFT, R. W. W; SCHREURS, A. M. M et al.Journal of applied crystallography. 2000, Vol 33, pp 893-898, issn 0021-8898, 3Article

Axial divergence in a conventional X-ray powder diffractometer. I. Theoretical foundationsCHEARY, R. W; COELHO, A. A.Journal of applied crystallography. 1998, Vol 31, pp 851-861, issn 0021-8898, 6Article

An improved gas-stream heating device for a single-crystal diffractometerSCHEUFLER, C; ENGEL, K. V; KIRFEL, A et al.Journal of applied crystallography. 1997, Vol 30, pp 411-412, issn 0021-8898, 3Article

Elimination of ghost reflections in X-ray diffraction topography using soller slitsBORN, E; METZGER, T; WILLIBALD-RIHA, E et al.Journal of applied crystallography. 1997, Vol 30, pp 320-323, issn 0021-8898, 3Article

Design of an inverted spindle axis for drozen crystal screening and storageGOODWILL, K. E; GRANDLUND, E; SANTARSIERO, B. D et al.Journal of applied crystallography. 1996, Vol 29, pp 738-740, issn 0021-8898, 6Article

Doing double-crystal diffraction experiments with a conventional four-circle diffractometerCHAO, W. K; GAO, E. Z; WONG, H. K et al.Review of scientific instruments. 1993, Vol 64, Num 9, pp 2558-2560, issn 0034-6748Article

Axial divergence in a conventional X-ray powder diffractometer. II. Realization and evaluation in a fundamental-parameter profile fitting procedureCHEARY, R. W; COELHO, A. A.Journal of applied crystallography. 1998, Vol 31, pp 862-868, issn 0021-8898, 6Article

Angle calculations for a '2+2' surface X-ray diffractometerEVANS-LUTTERODT, K. W; MAU-TSU TANG.Journal of applied crystallography. 1995, Vol 28, pp 318-326, issn 0021-8898, 3Article